- Tsui, S., Cmaidalka, J., Baikalov, A., Chu, C.W., Xue, Y.Y., and Sun, Y.Y.
- We investigate the polarity-dependent ﬁeld-induced resistive switching phenomenon driven by electric pulses in perovskite oxides. Our data show that the switching is a common occurrence restricted to an interfacial layer between a deposited metal electrode and the oxide. We determine through impedance spectroscopy that the interfacial layer is no thicker than 10 nm and that the switch is accompanied by a small capacitance increase associated with charge accumulation. Based on interfacial I–V characterization and measurement of the temperature dependence of the resistance, we propose that a ﬁeld-created crystalline defect mechanism, which is controllable for devices, drives the switch. © 2004 American Institute of Physics. [DOI: 10.1063/1.1768305]
- Resource Type:
- Campus Tesim:
- San Marcos